| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ee3552d15412fdb6041617ccd8af1c8e |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-32 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N11-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-06 |
| filingDate |
2003-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c7798686ba306abc042b4b2c7b879063
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5de9c7fa798c1049c1db67213f6dd60e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3668f69ec788eb678c9b4b27661b91f8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3d961f76417f72ee3a3b50ef5d3c8de3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_edcaddda707a819f6a45d9adff7c97e8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_493c6d9bf4b25d0520caef9772bc5296 |
| publicationDate |
2004-02-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
CA-2776036-A1 |
| titleOfInvention |
Apparatus and method for quantitatively measuring liquid film drying rates on substrates |
| abstract |
An apparatus and method for measuring the drying rate of a liquid or liquid film in air or other gaseous media by either: a) measuring changes in the print density of the liquid; b) measuring changes in the dynamic surface tension of the liquid; c) measuring the differential pressure between an inert gas required to displace a sample of the liquid drawn into a capillary tube from a reservoir of the liquid and the pressure required for a bubble of the gas to form in the reservoir; and d) measuring the electrical conductance or resistance of the liquid. |
| priorityDate |
2002-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |