Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_71272382f0142cf90b7e910fa57b9a1d |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01L3-0293 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01L2200-0689 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01L2300-046 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01L2300-0829 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-64 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01L3-50255 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6428 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6452 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-20 |
filingDate |
2008-12-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bc10f68c01cb926d43f82aa0f6f7813f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fb4df639ac671810f81842e10f749bce http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dff1cce8d5f77e08192873fc57f90830 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a878cfffbd34868617cf5507059ea1ff |
publicationDate |
2009-09-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
CA-2707035-A1 |
titleOfInvention |
High throughput methods for analysis of contamination in environmental samples |
abstract |
Use of high throughput methods to analyze samples for toxic elements originating from industrial hygiene and environmental sampling are described. These methods utilize optical detection methods using plates with arrays and microwells Methods to fabricate samples in such plates are described The invention is particularly illustrated by demonstrating its applicability for analysis of beryllium by fluorescence This invention also discloses the use of improved filtration method compatible with the high throughput methods of sample preparation and analysis |
priorityDate |
2007-12-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |