http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CA-2695022-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3e1018b924ad1e238642eaad9d2172a7 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-552 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-41 |
| filingDate | 2007-08-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c76bfccb82fad97877e9e5347e7f75f7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2c078ba248ff1004a0c80b305834461a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dcc5509b91dbf252c37013525aa4169d http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e357a20f5d06d2d96d44da261c1ea3ed http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_415a965959837ba44ba00b8b2c26b74c |
| publicationDate | 2009-02-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CA-2695022-A1 |
| titleOfInvention | Prism coupled silicon on insulator sensor |
| abstract | Methods and devices related to a sensor element for use in the detection and monitoring of molecular interactions. The sensor element uses a silicon-on-insulator wafer optically coupled to a silicon prism. The wafer has a thin silicon film top layer, a silicon substrate layer, and a buried silicon dioxide layer sandwiched between the silicon film and substrate layers. The wafer is coupled to the prism on the wafer's substrate side while the interactions to be monitored are placed on the wafer's silicon film side. An incident beam is directed at the prism and the incident angle is adjusted until the beam optically couples to the silicon film's optical waveguide mode. When this occurs, a decrease in the intensity of the reflected beam can be detected. The molecular interactions affect the phase velocity or wave vector of the propagating mode. Similarly, instead of measuring the incident angle at which optical coupling occurs, the phase of the reflected beam may be measured. |
| priorityDate | 2007-08-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.