http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CA-2544907-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_966a6c1f382ec9bcb5e3839dfd73e5b8 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-20 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-207 |
| filingDate | 2006-04-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_86caaf0914951730e4a66efd761f80e3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_52b0796a1a23f144aadc5635f4c2698a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_26e5de70f88a3e7da1ff9fe83294a211 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bd8449966b62aab0fdb72b4382828296 |
| publicationDate | 2006-11-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CA-2544907-A1 |
| titleOfInvention | Method and apparatus for x-ray diffraction analysis |
| abstract | A method for transmission mode X-ray diffraction analysis of a sample by means of an apparatus comprising an X-Ray radiation source (21) that provides X-ray radiation for irradiating the sample and a detector (22) for detecting X-ray radiation transmitted through and diffracted by the sample. The method comprises: (a) placing a sample to be analyzed on a substrate (19), (b) generating a strip-shaped X-ray beam (24) the central part of which extends along a plane, (c) positioning the substrate (19) and thereby the sample in an initial position in which said sample lies in the path of beam (24) and a slice (27) of the sample is irradiated by beam (24), (d) effecting the following movements of the substrate (19) with respect to the above mentioned initial position thereof: (d.1) a rotation of the substrate (19) and thereby of the sample around a rotation axis (29) which is perpendicular to the substrate, the rotation covering a predetermined rotation angle, and (d.2) a tilting of the substrate (19) and thereby of the sample around a tilting axis (28) and over a tilting angle (T) defined as the angle that the rotation axis (29) forms with the plane through which the central part of the beam (24) extends, the tilting axis lying in the plane through which the central part of the beam (24) extends and being perpendicular to the rotation axis (29), the tilting covering a tilting angle (T) that varies between a first predetermined value and a second predetermined value, and (e) detecting with the detector (22) X-ray radiation transmitted through and diffracted by the sample during a time interval over which the above mentioned movements of the substrate (19) are effected. |
| priorityDate | 2005-05-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID455346814 |
Total number of triples: 15.