| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_966a6c1f382ec9bcb5e3839dfd73e5b8 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G2320-029 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-3622
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-006 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G09G3-18 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-13
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G09G3-36
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G09G3-00 |
| filingDate |
2004-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9a5d321a768a0f31a3879122f7742429
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_61e0c61db6aba167ab6ffc55816903ee
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2963f6aeaddbcf345a9c32390d291eb1
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ce39e9e369bea67a9948af2097c2fd48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d32601ce72ebef84c16fdf0cbe9f0daf |
| publicationDate |
2004-10-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
CA-2521737-A1 |
| titleOfInvention |
Control system and control method for checking the function of liquid crystal displays |
| abstract |
The invention relates to a method and a measuring system for checking the function of liquid crystal displays comprising individual display segments, on the basis of the difference in the electrical capacitance Cseg of defective and intact display segments. The invention is based on the fact that the capacitance of the display segments is directly determined by measuring the stored electrical charge using a capacitance measuring method. According to the preferred measuring method, a charge transfer is carried out by a reference capacitor Cref, and the segment capacitance Cseg is determined as a result of a charge balance, preferably by means of a .DELTA..SIGMA. conversion. |
| priorityDate |
2003-04-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |