http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CA-2217591-C
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c85ecd85cfffe1be15ed90b3959362c3 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-326 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0735 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-32 |
| filingDate | 1997-10-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2003-07-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ebe6fa26f20a7d09ef4f74bca0da8771 |
| publicationDate | 2003-07-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CA-2217591-C |
| titleOfInvention | Wireless test fixture |
| abstract | A printed circuit board test fixture includes a plurality of flexible printed circuits having circuit traces on one side for interconnecting the test probe pin assemblies of the fixture with the interface connector pins for the interface panel of the fixture. The flexible circuits are folded in the fixture housing to provide spaced apart non-contacting layers of first contact areas for connection to the test probe pin assemblies and spaced apart non-contacting layers of second contact areas for connection to the interface connector pins. The layers of flexible circuit of each contact area receive the test probe pin assemblies and interface connector pins which secure the layers of flexible circuit in the fixture. The test probe pin assemblies and the interface connector pins make electrical and mechanical engagement with terminal apertures in the layers of flexible circuit. The layers further include through holes allowing the test probe pin assemblies and interface connector pins to pass through layers of the flexible circuit without making electrical contact with these layers. This permits circuit traces to be used on each of the layers of flexible circuit for selected test probe pin assembly and interface connector pin connected pairs. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102944832-A |
| priorityDate | 1997-10-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID4496 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID408976986 |
Total number of triples: 17.