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filingDate 1993-11-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1998-11-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1d5e73a1a51dd1c2f0c91c8c8cb652c7
publicationDate 1998-11-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CA-2102880-C
titleOfInvention System using induced current for contactless testing of wiring networks
abstract A method for measuring electrical characteristics of an electrical device having a conductive structure associated therewith involves the sequence of steps as follows: First, employ a low energy electron beam to charge all conductors on the surface of the device. Expose individual conductors to a focussed low energy electron beam serially. Make measurements of an induced current signal when individual conductors are exposed to the focussed electron beam. Analyze induced current measurements derived from the individual conductors. Then determine electrical characteristics of the device based on the analysis. A charge storage method and three capacitive test methods for defect detection and methods for shorts delineation are described.
priorityDate 1993-03-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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