http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CA-2090157-C

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-027
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y40-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y10-00
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F1-72
filingDate 1993-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1996-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8cc374eb596d7e966be3de6f5717366c
publicationDate 1996-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CA-2090157-C
titleOfInvention Mask for x-ray pattern delineation
abstract Fabrication of reflective masks, designed for use with x-ray delineating radiation in the construction of sub-micron devices, is expedited by use of a barrier layer intermediate the multilayer reflector and the absorber layer. The barrier is designed to reduce damage to the multilayer reflector during two stages of fabrication during initial patterning and during subtractive or additive mask repair. Composition of the barrier is so chosen as to minimize such damage during its removal in baring of the reflector, and also as to have requisite stability in regions retained during mask life.
priorityDate 1992-04-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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