| abstract |
O.Z. 0050/42487 Abstract of the Disclosure: A process for the selective modification and reversible removal of extremely fine structures having dimensions of down to the nanometer and subnanometer range from the surface of a solid, comprises moving the fine tip of a probe, for example a surface-sensitive scanning probe, which is located at a distance in the .ANG.ngstrom range above the surface or is in contact with the surface, over the structure at essentially the same height and thus causing a change in this structure. |