| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b5eab85b58ac538ffd025c7102cffb9d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9847ad17ba8ee826fdd7198107bd1973 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-21
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-553
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8422 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-658
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-00 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-84
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-552 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-21
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-65 |
| filingDate |
1991-02-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_27326e5107f720fca039471010af01b2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d008692c9674e2c8f39ee47d9b6b426f |
| publicationDate |
1991-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
CA-2035686-A1 |
| titleOfInvention |
Examination of physical properties of thin films |
| abstract |
- 8 - O.Z. 0050/41393 Abstract of the Disclosure: The physical properties of thin films can be examined with polarized light using a method which comprises directing polarized light at a layer system, exciting plasmon surface polaritons therein and thereby creating Raman-scattered light within the layer or layer system under examination, and imaging said light on a detector using an imaging system. |
| priorityDate |
1990-02-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |