http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CA-1293336-C

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_05060720d78cc9178696073231d89834
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-04
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-04
filingDate 1989-03-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1991-12-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4b7386e81d7f65040950d8d7f4caa9cd
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_80fa9c9ded4601ad444f72cdba76dd54
publicationDate 1991-12-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CA-1293336-C
titleOfInvention Test fixture for tab circuits and devices
abstract ABSTRACT A test fixture for TAB (Tape Automated Bonding) circuits includes circuit boards for maintaining a characteristic impedance to inner head bond areas of a circuit under test. A plurality of vertically disposed test pins are soldered to conductors in one of the circuit boards, and provide contacts for supplying power and test signals to test pads on a circuit under test. A thermoelectric heat pump is thermally connected to a circuit under test with a copper thermal chuck or heat spreader, and is used to subject the circuit to a wide range of operating temperatures. A two piece anvil is provided to apply pressure to the test pad/test pin interface and to the circuit die/thermal chuck interface.
priorityDate 1988-03-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID418354341

Total number of triples: 17.