http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CA-1264235-A

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-88
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-35
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C03B37-012
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-88
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B6-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01M11-00
filingDate 1985-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1990-01-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a7f52edec3eca33772976edaeac82cce
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_34d687a825e1afb47dc41221431d469f
publicationDate 1990-01-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CA-1264235-A
titleOfInvention Method for inspecting an optical fiber
abstract ABSTRACT OF THE DISCLOSURE By the present invention, internal defects within infrared optical fibers are inspected during the course of fabrication. The optical fiber is drawn from a fiber fabrication apparatus to a winding device through an integration sphere having an inlet opening, an outlet opening, an inner diffuse reflection surface and a photodetector. The method includes impinging a light beam emitted from a strong light source obliquely at the side surface of the optical fiber. By such impingement a portion of the obliquely-impinged light beam becomes a propagating light internally within the core of the fiber. The power existing in the integration sphere is measured by means of the photodetector. The positions and extents of defects are estimated by the time and amount of change of output power of the photodetector. The output power of the photodetector is heightened to a higher level when a defect exists within the optical fiber when it is in the integration sphere. The output power is lowered to a lower level when the defect within the optical fiber when the optical fiber is between the outlet of the integration sphere and the light source. The position and extent of the defects are thus estimated by the change of the output power of the photodetector.
priorityDate 1984-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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