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filingDate 1986-06-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1989-09-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 1989-09-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CA-1258967-A
titleOfInvention High-temperature resistant elongation measuring system formed of ceramic materials
abstract Abstract of the Disclosure: A device for measuring elongation of a structure includes mounts formed at least partially of electrically insulating ceramic ma-terial, the mounts having at least two points to be attached to a structure for shifting the mounts relative to each other upon elongation of the structure, and electrically conducting parts disposed on the mounts having electrical properties being in-fluenced by the shifting of the mounts, at least a portion of each of the electrically conducting parts being subjected to mechanical stresses, and at least the portions of the electrically conducting parts being formed of electrically conductive ceramic material.
priorityDate 1985-06-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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