http://rdf.ncbi.nlm.nih.gov/pubchem/patent/BR-102017011698-A2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7469bc6f6a2ed3378ab5246b62e8b4ff |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/D06M10-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-40 |
| filingDate | 2017-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_80aa2b9e9dd232faece68dd9bb6e4b95 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ba00670ddfb6f52af91afdf01756eb45 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_16233a6d64e7194b2ac48f73fa20ec84 |
| publicationDate | 2018-12-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | BR-102017011698-A2 |
| titleOfInvention | microwave resin infiltration method for transmission electron microscopy |
| abstract | Microwave resin infiltration method for transmission electron microscopy. A method for preparing specimens for transmission plane electron microscopy is described. The method employs the use of microwaves for rapid resin infiltration into the internal structures of various materials that give rise to integral structures and total resin fixation. The method is easy to apply. As a result, micrographs of materials prepared for transmission electron microscopy can be observed in their entirety. The method presents simple manipulation and high repeatability. It presents two phases only for the conclusion of the infiltration and can be produced in minutes. The method allows for reduced specimen preparation time as well as simultaneous sample preparation and concentration of the same sample in the same image. |
| priorityDate | 2017-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.