| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_240e1cd00a69820e67a50d867333fd02 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12R2001-865 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12N1-185
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12N1-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12N1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12Q1-06 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C12Q1-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-416 |
| filingDate |
2016-05-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_af8e6a6c7e6a39acecad82cece46403b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3f32f7ccac55133efeaf811d14c63132
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1c28db7352e2ca867a4233efe7df6b5b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_970895b62b04d2ad62f20af30517e6dc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_19a02e7b7193892ed2d035350ecfc122
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cec9de49de0f117176b14563e1436489
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_678ed9491c0915a60d51a05107fd8257 |
| publicationDate |
2017-11-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
BR-102016009956-A2 |
| titleOfInvention |
METHOD FOR CALCULATING MICROBIAL GROWTH KINETIC PARAMETERS FROM OPTICAL DENSITY READING (DO) |
| abstract |
Method for Calculating Microbial Growth Kinetic Parameters from Optical Density (DO) Reading The present invention is a method for microbial growth analysis, capable of correcting the optical density reading and calculating the kinetic growth parameters of single or multiple cultures. of microorganisms. The analysis of the data obtained allows the construction of individual growth curves (or predefined groups), the calculation of the specific growth rate and adaptation phase duration, the mounting histograms based on these values obtained with statistical analysis based on p- value. |
| priorityDate |
2016-05-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |