http://rdf.ncbi.nlm.nih.gov/pubchem/patent/BE-1000697-A6

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filingDate 1988-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1989-03-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b718290dc40cfb85f3df60f9eda5d172
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publicationDate 1989-03-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber BE-1000697-A6
titleOfInvention Device for testing integrated electrical circuits.
abstract Apparatus for testing an integrated circuit, comprising a thermal insulation enclosure (5), a test socket (10) housed in this enclosure and arranged to receive the circuit to be tested, associated test circuits, and a thermoelectric device (9 ) to vary the temperature of the case.
priorityDate 1987-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 27.