http://rdf.ncbi.nlm.nih.gov/pubchem/patent/AU-2008266860-B2

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filingDate 2008-06-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2012-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_011d50a3198f1d65c0e2ca85ea5f7c79
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publicationDate 2012-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber AU-2008266860-B2
titleOfInvention Sample scanning and analysis system and methods for using the same
abstract A system and methods for scanning and analyzing one or more characteristics of a sample utilizing electromagnetic radiation is described. More particularly, the system and methods utilize an electromagnetic radiation source connected to a transmitter and an analyzer connected to a receiver. A sample to be analyzed is placed between the transmitter and receiver and a frequency sweep of electromagnetic radiation is transmitted through the sample to create a series of spectral data sets, which are developed into a composite spectrogram by the analyzer and processed to determine one or more characteristics of the sample. A magnetic field can alternatively be applied around the transmitter, receiver and sample to enhance some characteristic analysis applications and to make other characteristic analysis applications possible. Samples include inert and living items and the characteristics include a wide variety of different applications. Although pattern recognition is utilized in some applications to match a present composite spectrogram with previously detected spectrograms, the present composite spectrogram can also be analyzed based on pattern components to make characteristic determinations without per-use calibration and without utilizing any pattern matching.
priorityDate 2007-06-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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